Apparatus and methods relating to enhanced spectral measurement systems
US7692784B2 · kind B2 · utility
13Cited by
92References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 27, 2004 |
| Grant date | Apr 6, 2010 |
| Priority date | — |
| Expiry date | Jul 2, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/3155
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The apparatus and methods herein provide light sources and spectral measurement systems that can improve the quality of images and the ability of users to distinguish desired features when making spectroscopy measurements by providing methods and apparatus that can improve the dynamic range of data from spectral measurement systems.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.