Method and apparatus for measuring resistance of a resistive sensor
US7692887B2 · kind B2 · utility
9Cited by
25References
40Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 13, 2006 |
| Grant date | Apr 6, 2010 |
| Priority date | — |
| Expiry date | Nov 16, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2005/0016
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for determining a head parameter value (e.g., head resistance) of a resistive head. A test head current is supplied to the head during a head parameter measurement interval using the same current sources that supply a bias current to the head during an operating (read operation) interval. The determined head parameter value is latched for use in setting the control loop gain for a control loop that controls the current sources during the operating interval.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.