System to calibrate on-die temperature sensor
US7695189B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 24, 2008 |
| Grant date | Apr 13, 2010 |
| Priority date | — |
| Expiry date | Jul 24, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/015
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system may include biasing of diodes of a temperature sensor disposed in an integrated circuit die using a current from an off-die current source, generation of a voltage based on the current and a temperature of the integrated circuit die, and determination of a first temperature based on the voltage. Such a system may further include amplification of the voltage using an oscillator and a chopper stabilizer, determination of a first amplified voltage associated with a first state of the oscillator and a second amplified voltage associated with a second state of the oscillator, and determination of a third voltage based on the first amplified voltage and the second amplified voltage, wherein determination of the first temperature based on the voltage comprises determination of the first temperature based on the third voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.