Three-dimensional structural damage localization system and method using layered two-dimensional array of capacitance sensors
US7698075B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 14, 2006 |
| Grant date | Apr 13, 2010 |
| Priority date | — |
| Expiry date | Feb 13, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for detecting damage to a structure is provided. The system includes a voltage source and at least one capacitor formed as a layer within the structure and responsive to the voltage source. The system also includes at least one sensor responsive to the capacitor to sense a voltage of the capacitor. A controller responsive to the sensor determines if damage to the structure has occurred based on the variance of the voltage of the capacitor from a known reference value. A method for sensing damage to a structure involves providing a plurality of capacitors and a controller, and coupling the capacitors to at least one surface of the structure. A voltage of the capacitors is sensed using the controller, and the controller calculates a change in the voltage of the capacitors. The method can include signaling a display system if a change in the voltage occurs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.