Radiation detector with controlled spectral sensitivity distribution

US7700905B2 · kind B2 · utility

Assignee

• OSRAM Opto Semiconductors GmbH · DE

Inventors

• Heinz Haas · Regensburg, DE
• Frank Möllmer · Bad Abbach, DE
• Michael Schwind · Sinzing, DE

Key dates

• Filing date: Aug 24, 2004
• Grant date: Apr 20, 2010
• Expiry date: Jun 28, 2025

Classification

• Technology area (CPC Y): Emerging Cross-Sectional Technologies
• CPC primary: Y02E10/544

Abstract

The invention concerns a radiation detector for detecting radiation having a defined spectral sensitivity distribution (14) that exhibits a sensitivity maximum at a defined wavelength λ0, wherein the radiation detector preferably contains a III-V semiconductor material and particularly preferably comprises at least one semiconductor chip (1) and at least one optical filter disposed after the semiconductor chip, the semiconductor chip containing at least one III-V semiconductor material and the optical filter absorbing radiation of a wavelength that is greater than the wavelength λ0 of the sensitivity maximum.