On-chip storage of hardware events for debugging
US7700945B2 · kind B2 · utility
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7Claims
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Key dates
| Filing date | Jun 21, 2006 |
| Grant date | Apr 20, 2010 |
| Priority date | — |
| Expiry date | May 9, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31705
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit (IC) die includes a plurality of edge counters. Each edge counter is provided to detect at least one change in signal level at a respective location on the IC die. The IC die is in communication with a memory and also includes an event recording circuit on the IC die provided to store states of the counters in the memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.