Electronic device testing system and method
US7702982B2 · kind B2 · utility
2Cited by
8References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2007 |
| Grant date | Apr 20, 2010 |
| Priority date | — |
| Expiry date | Oct 30, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/70
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a testing system and method suitable for determining whether a pin-out of an electrical component is properly connected to a PCB. The testing system includes a testing signal source, a signal detector, a signal processor, an analysis unit and an integrated circuit having boundary-scan test function to provide testing signals to the device under test (DUT) whose signal traces are passing through inner layer of PCB in order to detect whether the sensed signal is an error signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.