Patent · US Active

Creating high voltage FETs with low voltage process

US7704819B2 · kind B2 · utility

1Cited by
2References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 7, 2009
Grant dateApr 27, 2010
Priority date
Expiry dateJan 7, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/663

Abstract

An integrated circuit (IC) includes a high voltage first-conductivity type field effect transistor (HV-first-conductivity FET) and a high voltage second-type field effect transistor (HV-second-conductivity FET). The HV first-conductivity FET has a second-conductivity-well and a field oxide formed over the second-conductivity-well to define an active area. A first-conductivity-well is formed in at least a portion of the active area, wherein the first-conductivity-well is formed to have the capability to operate as a first-conductivity-drift portion of the HV-first-conductivity FET. The HV second-conductivity FET has a first-conductivity-well and a field oxide formed over the first-conductivity-well to define an active area. A channel stop region I s formed in at least a portion of the active area, wherein the channel stop region is formed to have the capability to operate as second-conductivity− drift portions of the HV-second-conductivity FET.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.