Phase frequency distortion measurement system
US7705609B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2007 |
| Grant date | Apr 27, 2010 |
| Priority date | — |
| Expiry date | Aug 23, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a method of measuring frequency distortions characteristics of a device under test, the device configured convert an input signal in an input frequency range to an output signal in a different output frequency range. The method includes, for each test frequency fi, where i=1, . . . , N and N a positive integer, in a selected frequency range, providing a corresponding test signal with multiple frequency components having a measurement component with a frequency fi, a first reference component with a frequency fA, and a second reference component with a frequency fB; inputting the test signals into the device under test; measuring output test signals at the output of the device under test corresponding to the input test signals; and determining, for each test frequency fi, information representative of frequency distortions based on the corresponding input test signal and the corresponding output test signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.