Bridge-enhanced nanoscale impedance microscopy
US7705617B1 · kind B1 · utility
2Cited by
4References
18Claims
0Family size
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Key dates
| Filing date | Jul 21, 2006 |
| Grant date | Apr 27, 2010 |
| Priority date | — |
| Expiry date | Dec 25, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/881
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Nanoscale impedance microscopy and related methods, circuit and/or apparatus capable of quantitatively measuring magnitude and phase of alternating current flow.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.