Method for recognizing patterns from assay results
US7705976B2 · kind B2 · utility
6Cited by
7References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 31, 2006 |
| Grant date | Apr 27, 2010 |
| Priority date | — |
| Expiry date | Feb 16, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/95623
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A Fourier transform optical detection system for use with a test assay that has a sensitivity pattern, the detection system including a lens having a Fourier transform plane and detectors located in the Fourier transform plane positioned in an arrangement of a Fourier transform pattern of the sensitivity pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.