Method of defining fault pattern of equipment and method of monitoring equipment using the same
US7707471B2 · kind B2 · utility
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20Claims
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Key dates
| Filing date | Aug 20, 2007 |
| Grant date | Apr 27, 2010 |
| Priority date | — |
| Expiry date | Oct 10, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/9501
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a method of forming reference information for defining a fault pattern of equipment, and monitoring equipment. One example embodiment method may include performing an angle spectrum analysis by re-classifying fault points distributed on a plane, the plane including a first component axis and a second component axis, and the re-classifying fault points including calculating an angle for each of the fault points with reference to any one of the first component axis and the second component axis of the plane, and forming a reference fault pattern for defining a fault pattern of the re-classified fault points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.