Method and apparatus for detecting an optical reflection indicative of a photodiode
US7709779B2 · kind B2 · utility
1Cited by
2References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 11, 2007 |
| Grant date | May 4, 2010 |
| Priority date | — |
| Expiry date | Jan 3, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/2803
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and methods for detecting semiconductor-based photodiodes. The present embodiments provide a simple and practical approach for identifying optical reflection that is indicative of photon reflection from semiconductor-based photodiodes. Thus in certain applications the present embodiments may be used to detect the presence of OIEDs, which may use photodiodes as part of a detonation system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.