Methods and apparatus to monitor contamination levels in a formation fluid
US7711488B2 · kind B2 · utility
10Cited by
16References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 18, 2007 |
| Grant date | May 4, 2010 |
| Priority date | — |
| Expiry date | Oct 16, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/3129
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods to monitor contamination levels in a formation fluid arc disclosed. An example method involves obtaining first property data indicative of a first fluid property of a formation fluid and second property data indicative of a second fluid property of the formation fluid. A correlation between the first and second property data is generated and third data is fitted to the correlation. A fitting parameter is determined based on the third data indicative of an amount of change of the first property data relative to an amount of change of the second property data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.