System and method for automated parameter measurement
US7711515B2 · kind B2 · utility
8Cited by
12References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 16, 2007 |
| Grant date | May 4, 2010 |
| Priority date | — |
| Expiry date | Nov 4, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K2207/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In accordance with the present invention, a method for automated parameter measurement includes strategically positioning an identifier tag at a location proximate a first object. The identifier tag stores location-specific information associated with the first object. A sensor in communications with the identifier tag receives the location-specific information from the identifier tag. Additionally, the sensor is used to collect quantitative data associated with a first parameter from the first object. The location-specific information received from the first identifier tag is used to process the quantitative data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.