Patent · US Active

Synchronizing clock and aligning signals for testing electronic devices

US7712014B2 · kind B2 · utility

1Cited by
2References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 9, 2007
Grant dateMay 4, 2010
Priority date—
Expiry dateAug 16, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31726
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A testing circuit includes a signal generator operative to provide a control signal in response to a reference clock signal. The control signal may include both alignment and timing information operative to synchronize the timing and output of the signal generator with a device under test. A clock recovery instrument is electrically coupled to the signal generator. The clock recovery instrument generates the reference clock signal in response to a clock signal from the device under test. The reference clock signal is synchronized with the clock signal from the device under test such that signal generator operation is synchronized with the device under test independent of the behavior of the device under test.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.