Method and apparatus for measuring source follower gain in an image sensor array
US7714266B2 · kind B2 · utility
2Cited by
5References
30Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 12, 2007 |
| Grant date | May 11, 2010 |
| Priority date | — |
| Expiry date | Sep 2, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/78
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Disclosed embodiments provide a method and apparatus for measuring the gain of output transistors of pixels in an imager device. Source/drain terminals of the output transistor and a reset transistor are driven with various input voltages to generate pixel output voltages. The slope of a line representing the relationship between the output voltages and the input voltages is determined. A component of the slope corresponding to gain not caused by the output transistor is removed from the slope to determine the gain of the output transistor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.