Apparatus and methods for direct quadrature sampling
US7714760B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 27, 2008 |
| Grant date | May 11, 2010 |
| Priority date | — |
| Expiry date | Jul 25, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L27/38
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Methods and apparatuses are provided for performing direct quadrature sampling. One method for sampling quadrature baseband components of a bandpass signal includes receiving a bandpass signal, sampling the bandpass signal using a first sampling clock and a second sampling clock, where the first and the second sampling clocks have the same frequency and are offset by a predetermined phase, and aligning the sampled signals temporally to produce in-phase and quadrature samples corresponding to baseband in-phase and quadrature components. An apparatus for directly sampling baseband quadrature components of a bandpass signal is also presented, which includes a first analog-to-digital converter (ADC) configured to receive a bandpass signal, a second ADC configured to receive the bandpass signal, where the second ADC has a clock having a phase offset with respect to clock signal of the first ADC, and an interpolator coupled to the first ADC configured provide coincident samples.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.