Method for classifying scientific materials such as silicate materials, polymer materials and/or nanomaterials
US7715002B2 · kind B2 · utility
3Cited by
2References
23Claims
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Key dates
| Filing date | Jan 23, 2007 |
| Grant date | May 11, 2010 |
| Priority date | — |
| Expiry date | Jan 15, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/1293
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided for characterizing a scientific material, such as a silicate material, a polymer material and/or nanomaterial. The method can include the steps of irradiating a measuring light of a predetermined wavelength range into material specimens, recording the measuring light reflected and/or reemitted by the material specimens, determining a ratio depending on the wave lengths of irradiated to detected measuring light (spectrum), and numerical-mathematical processing of spectral data of single material specimens for determining the characteristic features of the material specimens.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.