Three-dimensional shape measuring system
US7715020B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2007 |
| Grant date | May 11, 2010 |
| Priority date | — |
| Expiry date | Jan 3, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/2518
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional shape measuring system is provided with a measuring unit having a three-dimensional measurement range and adapted to measure the three-dimensional shape of a measurement object in a noncontact manner, a measurement range shifting unit for shifting the position of the measurement range of the measuring unit, a shape calculating unit for calculating the overall three-dimensional shape of the measurement object from a plurality of measurement data obtained by shifting the measurement range relative to the measurement object, and a judging unit for setting judgment areas in specified peripheral areas within the measurement range and judging the presence or absence of any unmeasured area of the measurement object outside the measurement range based on measurement data corresponding to the judgment areas. The measurement range shifting unit shifts the position of the measurement range in a direction toward the unmeasured area when the presence of the unmeasured area is judged by the judging unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.