Circuit and method for correction of defect pixel
US7715617B2 · kind B2 · utility
3Cited by
11References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 28, 2007 |
| Grant date | May 11, 2010 |
| Priority date | — |
| Expiry date | Jun 8, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10004
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor integrated circuit includes a check unit which compares a value of a pixel of interest with values of neighboring pixels contained in an image signal supplied from an image sensor, and determines based on the comparison whether the pixel of interest is defective, and a defect correcting unit which corrects the value of the pixel of interest by using values of surrounding pixels in response to the determination by the check unit that the pixel of interest is defective.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.