Method and apparatus for digital processing of images
US7715650B2 · kind B2 · utility
1Cited by
9References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 1, 2006 |
| Grant date | May 11, 2010 |
| Priority date | — |
| Expiry date | Mar 11, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for processing defects in a digital image include defining a defect map, having defect and non-defect entries, as a defect bounded by an expanded defect region and an outer analysis region of a different defect map values. By choosing suitable values and performing a bitwise logical OR operation on the entries the processing of the defect map is made more efficient.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.