Patent · US Active

Multiple access test points

US7719849B2 · kind B2 · utility

3Cited by

8References

17Claims

0Family size

Assignee

Scientific-Atlanta, Inc. · US

Inventors

Steven E. Blashewski · Duluth, US
Robert R. Riggsby · Atlanta, US
William G. Mahoney · Suwanee, US

Key dates

Filing date	Jul 7, 2006
Grant date	May 18, 2010
Priority date	—
Expiry date	Mar 17, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2844
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Included are systems and methods for providing access of test points. An embodiment of a system includes an electrical module including at least one electrical circuit configured to communicate at least one electrical signal, the electrical module further including at least one multiple access test point configured to provide access for measurements of the electrical circuit. Some embodiments include an environmental housing that includes at least one access port, the environmental housing configured to receive the electrical module such that at least one access port provides access to at least one multiple access test point.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.