Characterization of a frequency response for a frequency translation device
US7720137B2 · kind B2 · utility
2Cited by
3References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2006 |
| Grant date | May 18, 2010 |
| Priority date | — |
| Expiry date | Nov 6, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2822
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of characterizing the frequency response of a frequency translation device over a wide IF bandwidth is based on a two-dimensional model to generate calibration data for a device at run-time. The model is a function of a center frequency and frequency offset for a plurality of center frequencies over a wide system bandwidth to produce a frequency response at each center frequency. The frequency responses at each center frequency are scaled and normalized relative to a reference frequency and stored.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.