Structure characterization of images
US7720301B2 · kind B2 · utility
1Cited by
1References
21Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 4, 2004 |
| Grant date | May 18, 2010 |
| Priority date | — |
| Expiry date | Jan 7, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N7/012
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and system for characterizing structures in an image are presented. The method and system generates a structure checksum value based on a plurality of pixels in the image. The structure checksum is used as an index of a look-up table containing structure characteristics corresponding to the structure checksum values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.