Embedded Test I/O Engine
US7721260B2 · kind B2 · utility
6Cited by
8References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 8, 2004 |
| Grant date | May 18, 2010 |
| Priority date | — |
| Expiry date | Apr 9, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2236
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for testing input and output paths connected to an embedded processor. Specialized test software operating on the embedded processor creates one or more test workers or threads, each having a specific routine to perform, which are executed in parallel, stressing various communication paths. The results may be analyzed to help in many different ways during the life cycle of the device with the embedded controller.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.