Scanning nanotube probe device and associated method
US7721347B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 22, 2008 |
| Grant date | May 18, 2010 |
| Priority date | — |
| Expiry date | Nov 12, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2658
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and device are provided for determining, without contact, the physical and electrical properties of nanotube materials. The device includes a scanning probe configured to generate a signal of certain frequency onto the nanotube material and measure a reflected signal from the nanotube material, and a processor coupled to the scanning probe and configured to determine the physical and electrical properties of the nanotube material from the measured reflected signal. The method includes positioning a scanning probe relative to the nanotube material, generating a signal of certain frequency onto the nanotube material, and measuring a reflected signal from the nanotube material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.