Patent · US Active

Test socket

US7722361B2 · kind B2 · utility

11Cited by

11References

6Claims

0Family size

Inventors

Jose Lopez · Bellesserre, FR
Dennis B. Shell · Webster, US
Mathew L. Gilk · Lakeville, US

Key dates

Filing date	Nov 3, 2008
Grant date	May 25, 2010
Priority date	—
Expiry date	Nov 3, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/0466
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An improved test socket for use in testing integrated circuits. The test socket includes a housing having one or more slots formed therein. Contacts can be received within respective slots and maintained therein with rear ends of the contacts in engagement with traces on a load board. Mounting is accomplished by means of a pair of elastomers, and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.