Method and system for three-dimensional measurement
US7724380B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 15, 2006 |
| Grant date | May 25, 2010 |
| Priority date | — |
| Expiry date | May 15, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2200/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A three-dimensional measurement method is provided for measuring an object shape in a non-contact manner by using a non-contact sensor and a sensor moving mechanism that changes a position and a posture of the sensor and can operate by numerical control, moving the non-contact sensor in accordance with measurement path information indicating plural positions and postures of the sensor at the respective positions. The measurement path information is set in advance by teaching. The method includes performing preliminary three-dimensional measurement of the object in accordance with preliminary measurement path information, using shape data obtained by the preliminary three-dimensional measurement and shape data of an imaginary object as a measurement target in the teaching to detect positioning error between the object and the imaginary object, modifying the measurement path information depending on the detected positioning error, and performing three-dimensional measurement of the object in accordance with the modified measurement path information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.