Dielectrostrictive sensor for measuring deformation
US7726199B2 · kind B2 · utility
32Cited by
8References
24Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 23, 2008 |
| Grant date | Jun 1, 2010 |
| Priority date | — |
| Expiry date | Apr 23, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01L1/142
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method directed to a solid-state capacitance sensor for measuring a strain force on a dielectric including at least one pair of electrostriction sensors each sensor having at least two electrodes and each having a central axis. The central axes are disposed in a common plane and are oriented substantially mutually perpendicularly to one another. Preferably, at least two pairs of sensors, forming a rosette, are provided to facilitate multi-component analysis of a sample having dielectric properties under stress/strain.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.