Specimen holder having an insert for atomic force microscopy
US7727481B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 10, 2003 |
| Grant date | Jun 1, 2010 |
| Priority date | — |
| Expiry date | Dec 2, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/2525
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A specimen holder (10) is proposed in order to create a capability for preparing, in a cutting device, in particular a microtome or ultramicrotome, a specimen that is to examined in an AFM. The specimen holder (10) is embodied in several parts. It comprises an insert (12) in which the specimen is secured. Also provided is a receiving ring (14) in which the insert (12) can be received. The insert together with the receiving ring (14) is mounted, in particular thread-joined, on a base element (16). As a result of the mounting of the receiving ring (14) on the base element (16), the insert together with the specimen is fixed in its position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.