Patent · US Active

Method and apparatus for detecting positively charged and negatively charged ionized particles

US7728292B2 · kind B2 · utility

9Cited by

3References

31Claims

0Family size

Assignee

Ionics Mass Spectrometry Group, Inc.

Inventors

Charles Jolliffe · Schomberg, CA
Lisa Cousins · Vaughan, CA
Gholamreza Javahery · Branford, US

Key dates

Filing date	Aug 28, 2006
Grant date	Jun 1, 2010
Priority date	—
Expiry date	Feb 6, 2028

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/0095
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

An ion detector includes collision surfaces for converting both positively and negatively charged ions into emitted secondary electrons. Secondary electrons may be detected using an electron detector, than may, for example include an electron multiplier. Conveniently, secondary electrons (or electrons emitted by the multiplier) may be detected using an electron pulse counter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.