Method of making segmented contacts for radiation detectors using direct photolithography
US7728304B2 · kind B2 · utility
5Cited by
21References
29Claims
0Family size
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Key dates
| Filing date | Dec 4, 2006 |
| Grant date | Jun 1, 2010 |
| Priority date | — |
| Expiry date | Mar 22, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P70/50
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A method is provided for fabricating contacts on semiconductor substrates by direct lithography that results in durable adhesion of the electrodes, increased interpixel resistance and the electrodes which act as a blocking contact, thereby providing for improved energy resolution in a resultant radiation detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.