Systems for measuring magnetostriction in magnetoresistive elements
US7728585B2 · kind B2 · utility
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9References
20Claims
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Key dates
| Filing date | Jul 25, 2008 |
| Grant date | Jun 1, 2010 |
| Priority date | — |
| Expiry date | Jul 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for use when measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes a mechanism for applying a first magnetic field about parallel to a substrate having one or more magnetoresistive elements, and for applying a second magnetic field about perpendicular to the substrate and about parallel to magnetoresistive layers of the elements; and a mechanism for applying a mechanical stress to the substrate during application of the magnetic fields.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.