Test method for a variable capacitance measuring system
US7728603B2 · kind B2 · utility
3Cited by
4References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 7, 2005 |
| Grant date | Jun 1, 2010 |
| Priority date | — |
| Expiry date | May 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2605
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing a variable capacitance measurement system including a fixed voltage source, a variable capacitance sensor, and a circuit to process information output by this sensor. The method connects an electrically controllable electronic simulation device to replace the variable capacitance sensor, models the electrophysical behaviour of the sensor, and tests the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.