Automatic test component generation and inclusion into simulation testbench
US7730435B2 · kind B2 · utility
4Cited by
56References
10Claims
0Family size
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Key dates
| Filing date | Apr 30, 2007 |
| Grant date | Jun 1, 2010 |
| Priority date | — |
| Expiry date | Apr 4, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus are provided for efficiently generating test components for testing and evaluating a design under test. As a design is being configured, generated test components are made available. In one example, test components are automatically generated and included in a simulation testbench based on selected components in the design. Generally, the test components complement the selected components in the design. Moreover, the test components can be automatically seeded with initial contents.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.