Patent · US Active

Layered beam measurement apparatus

US7730630B1 · kind B1 · utility

7Cited by

13References

17Claims

0Family size

Assignee

Design to Manufacturing, Inc. · US

Inventors

Brian Lamb · San Diego, US
David Titzler · Palo Alto, US
Heather Fleming · Palo Alto, US

Key dates

Filing date	Nov 3, 2006
Grant date	Jun 8, 2010
Priority date	—
Expiry date	Jun 30, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01B2003/1051
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A new and improved tape rule that increases stiffness and standout length over standard tape rules is disclosed. The tape rule includes a primary rule and a secondary rule, the secondary rule providing increased strength. This invention can provide a variety of benefits, including increased blade flexibility while performing short extension related tasks, increased standout and reduced sag while performing tasks requiring longer extensions, reduced size and weight for tasks requiring the longest extensions and adds the ability to utilize alternate measurement methods or units and built in computational references.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.