Method and system for offset estimation and alignment
US7734084B2 · kind B2 · utility
8Cited by
11References
20Claims
0Family size
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Key dates
| Filing date | Oct 20, 2006 |
| Grant date | Jun 8, 2010 |
| Priority date | — |
| Expiry date | Apr 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for determining an offset vector. The method includes obtaining an image of a first feature. An image of a second feature is also obtained. Also, a combination image of the first feature and the second feature is obtained. A plurality of composite images is utilized to determine an accurate offset vector between the first feature and the second feature in the combination image. The plurality of composite images is based on the image of the first feature and the image of the second feature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.