System and method for performing wavelet-based texture feature extraction and classification
US7734107B2 · kind B2 · utility
Assignees
Inventor
Key dates
| Filing date | Feb 24, 2006 |
| Grant date | Jun 8, 2010 |
| Priority date | — |
| Expiry date | Apr 7, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method are disclosed for performing wavelet-based local texture feature extraction and classification procedures. Image data is initially provided to include a query image and a series of test images. A feature detector calculates image parameters corresponding to the image data. The image parameters include mean absolute values, variance values, and texture angles. The feature detector utilizes the image parameters to calculate distance values that represent texture similarity characteristics between the query image and each of the test images. The feature detector then evaluates the distance values to determine one or more matching images from among the test images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.