Automatic image feature embedding
US7734118B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2004 |
| Grant date | Jun 8, 2010 |
| Priority date | — |
| Expiry date | Jan 24, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T3/153
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention features a method, system, and computer program product. A source bitmap image, a destination bitmap image, a source image feature outline surrounding a source region of the source bitmap image, and a destination image feature outline surrounding a destination region of the destination bitmap image are received. A point-to-point correspondence between the source image feature outline and the destination image feature outline is generated, such that the point-to-point correspondence defines a reshaping of the source image feature outline. An interpolation surface is calculated interpolating an area of the source bitmap image that includes the source region. The interpolation surface is reshaped using the point-to-point correspondence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.