Systems and methods for monitoring moving surfaces using light signals
US7734435B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2007 |
| Grant date | Jun 8, 2010 |
| Priority date | — |
| Expiry date | Jun 19, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01P3/68
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This present specification provides, amongst other things, an electro-optical monitoring system for obtaining a once-per revolution signal based on the surface reflection of a rotating device that mandates non-contacting sensor input in potentially hostile environments. The system can use optical and electronic sections to illuminate and detect surface reflections from the rotating surface using existing mounting locations on the periphery of the machine to be measured. The electronic portion is configured to determine a unique mark as the once-per-revolution marker or allow an attending operator to assign a specific marker based on the observed reflected pattern. The optical portion consists of a light source, receiver, and optics that allow for focused and directed light paths.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.