Method for puncturing a low density parity check code
US7734988B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 2, 2006 |
| Grant date | Jun 8, 2010 |
| Priority date | — |
| Expiry date | Feb 22, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M13/6362
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method for puncturing a Low Density Parity Check (LDPC). The method includes a) setting a codeword length and the total number of bit nodes to be punctured; b) selecting a check node (or check nodes) with highest priority excluding check nodes completely checked in a current round; c) selecting a bit node (or bit nodes) with a highest priority excluding bit nodes completely checked among bit nodes connected to the selected check node (or check nodes); d) determining whether the selected bit node is a bit node to be punctured, that is, it is not systematic, not set by a puncturing prohibition flag; e) puncturing an associated bit node if the selected bit node is the bit node to be punctured, setting unpunctured bit nodes connected to the selected check node by a puncturing prohibition flag, decreasing the number of remained bit nodes to be punctured by 1 and increasing the number of connected punctured node of associated check node by 1; f) determining whether the number of remaining bits to be punctured is greater than 0; and g) returning to step b) if the number of remaining bits to be punctured is greater than 0, and ending a puncturing process if the number of remaining bits t…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.