Smart probe
US7735234B2 · kind B2 · utility
108Cited by
17References
45Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2007 |
| Grant date | Jun 15, 2010 |
| Priority date | — |
| Expiry date | Aug 31, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present system, method, article of manufacture, software, and apparatus is an “intelligent” probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error free probe swapping on a CMM.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.