Position detection system using laser speckle
US7737959B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 8, 2005 |
| Grant date | Jun 15, 2010 |
| Priority date | — |
| Expiry date | Mar 24, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2203/04109
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A detection system. The detection system includes a substrate, a laser, and a sensor array. The substrate includes a first surface, a second surface conceptually divided into multiple areas, and a third surface. The laser is configured to emit electromagnetic radiation into the substrate and incident subsequently onto second surface areas. The sensor array is configured to capture electromagnetic radiation reflected from the second surface. If a first dielectric, having first dielectric constant, is in contact with some areas, electromagnetic radiation incident thereon experiences total internal reflection and if a second dielectric having second dielectric constant is in contact with other areas, some of the electromagnetic radiation incident thereon is reflected back into the substrate by the second dielectric. The sensor array is configured to detect laser speckle originating from the incidence of the electromagnetic radiation at the second surface and to detect electromagnetic radiation reflected from the second dielectric.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.