Electromagnetic wave detector with an optical coupling surface comprising lamellar patterns
US7741594B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 26, 2004 |
| Grant date | Jun 22, 2010 |
| Priority date | — |
| Expiry date | Jun 16, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F77/413
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
The invention relates to a detector comprising a multiple quantum well structure operating on interband or intersubband transitions by absorption of radiation having a wavelength λ having a polarization comprising a component perpendicular to the plane of the multiple quantum well structure, and comprising optical coupling means for coupling said radiation, wherein the coupling means comprise a set of first diffractive lamellar features that are distributed along at least a first direction and a set of second diffractive lamellar features that are distributed along at least a second direction, said first and second directions being mutually perpendicular and lying in a plane parallel to the plane of the multiple quantum well structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.