Measuring a surface characteristic
US7742168B2 · kind B2 · utility
2Cited by
5References
33Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 15, 2004 |
| Grant date | Jun 22, 2010 |
| Priority date | — |
| Expiry date | Nov 16, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8917
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
At least one surface characteristic of a sample, e.g. gloss, refractive index, micro-roughness, macroroughness, colour shift, is determined by illuminating a surface of the sample with a collimated beam of light at an angle to the plane of the surface and using an imaging detector to record an intensity and angular distribution image of the light from the beam reflected from the surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.