Patent · US Expired

Apparatus and method for photomask design

US7743359B2 · kind B2 · utility

5Cited by
11References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 13, 2005
Grant dateJun 22, 2010
Priority date
Expiry dateSep 6, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/20
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An apparatus and method of synthesizing a photolithographic data set includes using a first computational model to calculate a first figure-of-merit for the photolithographic data set; changing a first part of the photolithographic data set to increase the first figure-of-merit; and then using a second computational model to calculate a second figure-of-merit of the photolithographic data set; and changing a second part of the photolithographic data set to increase the second figure-of-merit. The second computational model enables figure-of-merit calculations to be executed at a significantly faster execution rate than the first computational model.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.