Axial flow scan testable filter system
US7743646B2 · kind B2 · utility
0Cited by
8References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 27, 2007 |
| Grant date | Jun 29, 2010 |
| Priority date | — |
| Expiry date | May 10, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2015/084
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
A filter system having in-situ scan capabilities is provided. In one embodiment of the invention, the system includes a downstream probe which may be rotated to scan the field of a filter installed in the system. The probe may be utilized for leak detection, velocity measurements, efficiency testing and the like. In one embodiment, one or more probes are rotated downstream of the filter to scan the downstream face of the filter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.