Sample holder for an optical element
US7746465B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 28, 2007 |
| Grant date | Jun 29, 2010 |
| Priority date | — |
| Expiry date | Jan 4, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The sample holder includes support having a thickness and an aperture through the thickness of the support. A tilt mechanism is connected to the support for controlled tilting of the support, and the aperture through the support is configured to have a diameter that increases in a direction through the thickness of the support. This arrangement enables a light beam to pass through the same given area of the sample, irrespective of whether the sample is held perpendicular to the beam or held at a tilted position relative to the beam. In one embodiment, the holder includes an efficient magnetic clamp mechanism for securing the sample to the holder. The holder compactly integrates with tilting mechanisms a sample rotation mechanism.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.