Method of using biased charging/transfer roller as in-situ voltmeter and photoreceptor thickness detector and method of adjusting xerographic process with results
US7747184B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2006 |
| Grant date | Jun 29, 2010 |
| Priority date | — |
| Expiry date | Aug 19, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03G15/553
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
The dielectric thickness of a photoreceptor is determined in a variety of ways, including using a relationship between threshold voltage and dielectric thickness, using a relationship between dielectric thickness and the difference between biased transfer roller (BTR) voltage and photoreceptor surface potential, using a relationship between dielectric thickness and biased charging roller (BCR) impedance, using a relationship between dielectric thickness and the slope of the DC current vs. voltage curve for the BTR or the BCR, and using a relationship between dielectric thickness and the BTR voltage at zero current. The threshold voltage can be found by using the slope of the BCR DC current vs. voltage curve, measuring photoreceptor surface potential for a plurality of target values below the charging knee to obtain the intercept value, or finding the actual value of the charging knee. A method of using the BCR as an electrodynamic voltmeter is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.